Reduce Test Time, Not Test Quality.
Smart and Real-Time Adaptive Test Time Reduction
NI believes that there is always a smarter, more efficient approach to semiconductor, and we know applying this approach to the industry has never been more vital than it is today. We are meeting the urgency faced by semiconductor producers with test-time reduction solutions that optimize without compromise.
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In the semiconductor industry today, timing is everything. NI’s adaptive real-time test reduction gives you the edge you need to accelerate test processes across your entire product lifecycle. All without sacrificing your test quality.
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Revolutionize Semiconductor Testing with NI ATTR
As semiconductor growth remains on the rise, so does the industry’s challenges to keep up with demand. How can semiconductor producers respond to these challenges in order to reduce test time, cut test costs, and increase overall efficiency?
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